Technical Program

Paper Detail

Session:Microwave to Sub-millimeter Measurements/Standards
Location:Room 211
Session Time:Thursday, July 11, 15:20 - 17:00
Presentation Time:Thursday, July 11, 16:40 - 17:00
Presentation: Oral
Paper Title: Uncertainty Evaluation of Rydberg Atom-based RF E-field Metrology
Authors: Haiyang Zou, Southeast University, China; Zhenfei Song, Wanfeng Zhang, National Institute of Metrology, China; Jie Zhang, China Jiliang University, China