Technical Program

Paper Detail

Session:Imaging, Scattering and Remote Sensing
Location:Room 212
Session Time:Friday, July 12, 08:00 - 11:40
Presentation Time:Friday, July 12, 10:20 - 10:40
Presentation: Oral
Paper Title: Data Averaging Enhancements of the Predictive Accuracy of Machine-Learning-Based Microwave Sensing for Estimating Cranberry Fruit Yields
Authors: Alex Haufler, John Booske, Susan Hagness, University of Wisconsin-Madison, United States