Paper: | TH-UA.3P.5 | ||
Session: | Microwave to Sub-millimeter Measurements/Standards | ||
Session Time: | Thursday, July 11, 15:20 - 17:00 | ||
Presentation Time: | Thursday, July 11, 16:40 - 17:00 | ||
Presentation: | Oral | ||
Paper Title: | Uncertainty Evaluation of Rydberg Atom-based RF E-field Metrology | ||
Authors: | Haiyang Zou, Southeast University, China; Zhenfei Song, Wanfeng Zhang, National Institute of Metrology, China; Jie Zhang, China Jiliang University, China |